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Journal Articles

Magnetic sensitivity distribution of Hall devices in antiferromagnetic switching experiments

Schreiber, F.*; Meer, H.*; Schmitt, C.*; Ramos, R.*; Saito, Eiji; Baldrati, L.*; Kl$"a$ui, M.*

Physical Review Applied (Internet), 16(6), p.064023_1 - 064023_9, 2021/12

https://doi.org/10.1103/PhysRevApplied.16.064023
 Times Cited Count：3 Percentile：27.71(Physics, Applied)

Journal Articles

Paramagnetic spin Hall magnetoresistance

Oyanagi, Koichi*; Gomez-Perez, J. M.*; Zhang, X.-P.*; Kikkawa, Takashi*; Chen, Y.*; Sagasta, E.*; Chuvilin, A.*; Hueso, L. E.*; Golovach, V. N.*; Sebastian Bergeret, F.*; et al.

Physical Review B, 104(13), p.134428_1 - 134428_14, 2021/10

https://doi.org/10.1103/PhysRevB.104.134428
 Times Cited Count：14 Percentile：77.64(Materials Science, Multidisciplinary)

Journal Articles

Spin Hall magnetoresistance in Pt/Cr$$_2$$O$$_3$$/YIG structure

Qi, J.*; Hou, D.*; Chen, Y.*; Saito, Eiji; Jin, X.*

Journal of Magnetism and Magnetic Materials, 534, p.167980_1 - 167980_6, 2021/09

https://doi.org/10.1016/j.jmmm.2021.167980
 Times Cited Count：1 Percentile：7.92(Materials Science, Multidisciplinary)

Journal Articles

Efficient spin torques in antiferromagnetic CoO/Pt quantified by comparing field- and current-induced switching

Baldrati, L.*; Schmitt, C.*; Gomonay, O.*; Lebrun, R.*; Ramos, R.*; Saito, Eiji; Sinova, J.*; Kl$"a$ui, M.*

Physical Review Letters, 125(7), p.077201_1 - 077201_6, 2020/08

https://doi.org/10.1103/PhysRevLett.125.077201
 Times Cited Count：36 Percentile：91.79(Physics, Multidisciplinary)

Journal Articles

Spin transport in antiferromagnetic insulators; Progress and challenges

Hou, D.*; Qiu, Z.*; Saito, Eiji

NPG Asia Materials, 11, p.35_1 - 35_6, 2019/07

https://doi.org/10.1038/s41427-019-0135-9
 Times Cited Count：40 Percentile：84.83(Materials Science, Multidisciplinary)

Journal Articles

Antiferromagnetic NiO thickness dependent sign of the spin Hall magnetoresistance in $$gamma$$-Fe$$_2$$O$$_3$$/NiO/Pt epitaxial stacks

Dong, B.-W.*; Baldrati, L.*; Schneider, C.*; Niizeki, Tomohiko*; Ramos, R.*; Ross, A.*; Cramer, J.*; Saito, Eiji; Kl$"a$ui, M.*

Applied Physics Letters, 114(10), p.102405_1 - 102405_5, 2019/03

https://doi.org/10.1063/1.5080766
 Times Cited Count：11 Percentile：49.82(Physics, Applied)

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